Ozgun,O.Sevgi,L.2024-05-252024-05-252015978-147997815-11522-396510.1109/APS.2015.73053112-s2.0-84953725000https://doi.org/10.1109/APS.2015.7305311https://hdl.handle.net/20.500.14517/2328IEEE Antennas and Propagation Society; The Institute of Electrical and Electronics EngineersFinite element (FEM) diffraction modeling of double-tip structure is presented and its accuracy is compared with the uniform theory of diffraction (UTD) and the method of moments (MoM). The locally-conformal perfectly matched layer (PML) approach is utilized to truncate the infinitely-long structure in a finite-sized computational domain. Diffracted field is obtained by using a four-step procedure which extracts the diffracted field from scattered field. Numerical results are demonstrated. © 2015 IEEE.eninfo:eu-repo/semantics/closedAccess[No Keyword Available]Conference ObjectQ42015-October184418450