Browsing by Author "Kaypmaz,T.C."

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    Citation Count: 17
    An advanced cell model for diagnosing faults in operation of Li-ion polymer batteries
    (2011) Kaypmaz,T.C.; Tuncay,R.N.
    In this paper, an advanced cell model is proposed providing a better State of Health (SoH) determination for diagnosing faults during the operation of Li-ion Polymer batteries comparing to classical cell models. Li-ion polymer cell kinetic parameters were obtained by electrochemical impedance spectroscopy method and changes in these parameters were analyzed theoretically in cases of forced charging and discharging. It was observed that classical cell models were not sufficient enough to mimic the irreversible effects on Li-ion polymer cells caused by improper charging and discharging processes. Therefore cell equivalent circuit was improved and classified according to failure states. A new fuzzy logic based SoH evaluation method was developed from experimental results. This model provides means for better classification to define the irreversible changes that cells encounter in their lifetime. © 2011 IEEE.
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    Citation Count: 6
    Diagnosing overcharge behavior in operation of Li-ion polymer batteries
    (2012) Kaypmaz,T.C.; Tuncay,R.N.
    In this paper, overcharging effects of Li-ion polymer cells were investigated and classified with respect to vehicle safety concerns. An advanced cell model is proposed providing better State of Health (SoH) determination for overcharge behavior in operation of Li-ion Polymer batteries. Li-ion polymer cell kinetic parameters were obtained using Electrochemical Impedance Spectroscopy (EIS) method and changes in these parameters were analyzed theoretically in cases of forced charging. Cell equivalent circuit was improved and additional parameters detected according to overcharge states. This yields a better detection and diagnosis capability for Battery Management System (BMS). These equivalent circuits and experimental results provide better classification when defining the irreversible changes caused by overcharging. © 2012 IEEE.