EMC Tests and Measurements
dc.authorwosid | Sevgi, Levent/GRE-8342-2022 | |
dc.contributor.author | Sevgi, Levent | |
dc.date.accessioned | 2024-10-15T20:21:06Z | |
dc.date.available | 2024-10-15T20:21:06Z | |
dc.date.issued | 2017 | |
dc.department | Okan University | en_US |
dc.department-temp | [Sevgi, Levent] Raytheon Syst Canada, Sci Res Grp, Richmond, BC, Canada; [Sevgi, Levent] Turkish Sci Res & Technol Council, TUBITAK MRC Informat Technol Res Inst, Dept Elect Syst, Istanbul, Turkey; [Sevgi, Levent] Dogus Univ, Fac Engn, Elect & Commun Engn Dept, Istanbul, Turkey; [Sevgi, Levent] Univ Massachusetts, Lowell, MA 01854 USA; [Sevgi, Levent] Okan Univ, Fac Engn & Architecture, Elect & Elect Engn Dept, Istanbul, Turkey | en_US |
dc.description.abstract | [No Abstract Available] | en_US |
dc.description.woscitationindex | Book Citation Index – Science | |
dc.identifier.citation | 0 | |
dc.identifier.doi | [WOS-DOI-BELIRLENECEK-106] | |
dc.identifier.endpage | 246 | en_US |
dc.identifier.isbn | 9781630813833 | |
dc.identifier.startpage | 223 | en_US |
dc.identifier.uri | https://hdl.handle.net/20.500.14517/6605 | |
dc.identifier.wos | WOS:000399505700009 | |
dc.institutionauthor | Sevgi, Levent | |
dc.language.iso | en | |
dc.publisher | Artech House | en_US |
dc.relation.ispartofseries | Artech House Electromagnetic Analysis Series | |
dc.relation.publicationcategory | Kitap Bölümü - Uluslararası | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | [No Keyword Available] | en_US |
dc.title | EMC Tests and Measurements | en_US |
dc.type | Book Part | en_US |
dspace.entity.type | Publication |