Finite element modeling of double-tip diffraction
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Date
2015
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Institute of Electrical and Electronics Engineers Inc.
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Abstract
Finite element (FEM) diffraction modeling of double-tip structure is presented and its accuracy is compared with the uniform theory of diffraction (UTD) and the method of moments (MoM). The locally-conformal perfectly matched layer (PML) approach is utilized to truncate the infinitely-long structure in a finite-sized computational domain. Diffracted field is obtained by using a four-step procedure which extracts the diffracted field from scattered field. Numerical results are demonstrated. © 2015 IEEE.
Description
IEEE Antennas and Propagation Society; The Institute of Electrical and Electronics Engineers
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0
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Q4
Source
IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) -- IEEE Antennas and Propagation Society International Symposium, APS 2015 -- 19 July 2015 through 24 July 2015 -- Vancouver -- 117292
Volume
2015-October
Issue
Start Page
1844
End Page
1845