Short Visits to Iran and India: Invitations from the IEEE Student Branches

dc.authorscopusid 7004386207
dc.authorscopusid 55320583500
dc.authorscopusid 55402960400
dc.contributor.author Sevgi,L.
dc.contributor.author Karim,M.F.
dc.contributor.author Chandrasekaran,K.T.
dc.date.accessioned 2024-05-25T12:33:00Z
dc.date.available 2024-05-25T12:33:00Z
dc.date.issued 2019
dc.department Okan University en_US
dc.department-temp Sevgi L., Electrical and Electronics OKAN University, Istanbul, Turkey; Karim M.F., Electrical and Electronics OKAN University, Istanbul, Turkey; Chandrasekaran K.T., Electrical and Electronics OKAN University, Istanbul, Turkey en_US
dc.description.abstract [No abstract available] en_US
dc.identifier.citationcount 1
dc.identifier.doi 10.1109/MAP.2019.2900223
dc.identifier.endpage 111 en_US
dc.identifier.issn 1045-9243
dc.identifier.issue 2 en_US
dc.identifier.scopus 2-s2.0-85064053636
dc.identifier.scopusquality Q1
dc.identifier.startpage 109 en_US
dc.identifier.uri https://doi.org/10.1109/MAP.2019.2900223
dc.identifier.uri https://hdl.handle.net/20.500.14517/2416
dc.identifier.volume 61 en_US
dc.identifier.wosquality Q2
dc.language.iso en
dc.publisher IEEE Computer Society en_US
dc.relation.ispartof IEEE Antennas and Propagation Magazine en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.scopus.citedbyCount 1
dc.subject [No Keyword Available] en_US
dc.title Short Visits to Iran and India: Invitations from the IEEE Student Branches en_US
dc.title.alternative Testing Ourselves en_US
dc.type Article en_US

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