Short Visits to Iran and India: Invitations from the IEEE Student Branches

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dc.authorscopusid7004386207
dc.authorscopusid55320583500
dc.authorscopusid55402960400
dc.contributor.authorSevgi,L.
dc.contributor.authorKarim,M.F.
dc.contributor.authorChandrasekaran,K.T.
dc.date.accessioned2024-05-25T12:33:00Z
dc.date.available2024-05-25T12:33:00Z
dc.date.issued2019
dc.departmentOkan Universityen_US
dc.department-tempSevgi L., Electrical and Electronics OKAN University, Istanbul, Turkey; Karim M.F., Electrical and Electronics OKAN University, Istanbul, Turkey; Chandrasekaran K.T., Electrical and Electronics OKAN University, Istanbul, Turkeyen_US
dc.description.abstract[No abstract available]en_US
dc.identifier.citation1
dc.identifier.doi10.1109/MAP.2019.2900223
dc.identifier.endpage111en_US
dc.identifier.issn1045-9243
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-85064053636
dc.identifier.scopusqualityQ1
dc.identifier.startpage109en_US
dc.identifier.urihttps://doi.org/10.1109/MAP.2019.2900223
dc.identifier.urihttps://hdl.handle.net/20.500.14517/2416
dc.identifier.volume61en_US
dc.identifier.wosqualityQ2
dc.language.isoen
dc.publisherIEEE Computer Societyen_US
dc.relation.ispartofIEEE Antennas and Propagation Magazineen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subject[No Keyword Available]en_US
dc.titleShort Visits to Iran and India: Invitations from the IEEE Student Branchesen_US
dc.title.alternativeTesting Ourselvesen_US
dc.typeArticleen_US
dspace.entity.typePublication

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