Testing ourselves

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dc.authorscopusid7004386207
dc.contributor.authorSevgi,L.
dc.date.accessioned2024-05-25T12:31:35Z
dc.date.available2024-05-25T12:31:35Z
dc.date.issued2014
dc.departmentOkan Universityen_US
dc.department-tempSevgi L., Okan University, Faculty of Engineering and Architecture, Electrical and Electronics Eng. Dept., Istanbul, Turkeyen_US
dc.description.abstract[No abstract available]en_US
dc.identifier.citationcount0
dc.identifier.doi10.1109/MAP.2014.7011077
dc.identifier.endpage318en_US
dc.identifier.issn1045-9243
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-84921805007
dc.identifier.scopusqualityQ1
dc.identifier.startpage317en_US
dc.identifier.urihttps://doi.org/10.1109/MAP.2014.7011077
dc.identifier.urihttps://hdl.handle.net/20.500.14517/2302
dc.identifier.volume56en_US
dc.identifier.wosqualityQ2
dc.language.isoen
dc.publisherIEEE Computer Societyen_US
dc.relation.ispartofIEEE Antennas and Propagation Magazineen_US
dc.relation.publicationcategoryDiğeren_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount0
dc.subject[No Keyword Available]en_US
dc.titleTesting ourselvesen_US
dspace.entity.typePublication

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