Testing Ourselves
| dc.contributor.author | Sevgi, Levent | |
| dc.date.accessioned | 2024-10-15T20:19:02Z | |
| dc.date.available | 2024-10-15T20:19:02Z | |
| dc.date.issued | 2014 | |
| dc.department | Okan University | en_US |
| dc.department-temp | Okan Univ, Fac Engn & Architecture, Elect & Elect Engn Dept, Istanbul, Turkey | en_US |
| dc.description.abstract | [No Abstract Available] | en_US |
| dc.description.woscitationindex | Science Citation Index Expanded | |
| dc.identifier.citation | 0 | |
| dc.identifier.doi | [WOS-DOI-BELIRLENECEK-168] | |
| dc.identifier.endpage | 288 | en_US |
| dc.identifier.issn | 1045-9243 | |
| dc.identifier.issn | 1558-4143 | |
| dc.identifier.issue | 5 | en_US |
| dc.identifier.scopusquality | Q1 | |
| dc.identifier.startpage | 288 | en_US |
| dc.identifier.uri | https://hdl.handle.net/20.500.14517/6419 | |
| dc.identifier.volume | 56 | en_US |
| dc.identifier.wos | WOS:000346014100023 | |
| dc.identifier.wosquality | Q2 | |
| dc.institutionauthor | Sevgi, Levent | |
| dc.language.iso | en | |
| dc.publisher | Ieee-inst Electrical Electronics Engineers inc | en_US |
| dc.relation.publicationcategory | Diğer | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | [No Keyword Available] | en_US |
| dc.title | Testing Ourselves | en_US |
| dc.type | Editorial | en_US |
| dspace.entity.type | Publication |