Finite Element Modeling of Double-tip Diffraction
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Date
2015
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Ieee
Abstract
Finite element (FEM) diffraction modeling of double-tip structure is presented and its accuracy is compared with the uniform theory of diffraction (UTD) and the method of moments (MoM). The locally-conformal perfectly matched layer (PML) approach is utilized to truncate the infinitely-long structure in a finite-sized computational domain. Diffracted field is obtained by using a four-step procedure which extracts the diffracted field from scattered field. Numerical results are demonstrated.
Description
Ozgun, Ozlem/0000-0002-3545-0541
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Q4
Source
IEEE International Symposium on Antennas and Propagation / USNC/URSI National North American Radio Science Meeting -- JUL 19-24, 2015 -- Vancouver, CANADA
Volume
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Start Page
1844
End Page
1845