Finite Element Modeling of Double-tip Diffraction

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Date

2015

Journal Title

Journal ISSN

Volume Title

Publisher

Ieee

Abstract

Finite element (FEM) diffraction modeling of double-tip structure is presented and its accuracy is compared with the uniform theory of diffraction (UTD) and the method of moments (MoM). The locally-conformal perfectly matched layer (PML) approach is utilized to truncate the infinitely-long structure in a finite-sized computational domain. Diffracted field is obtained by using a four-step procedure which extracts the diffracted field from scattered field. Numerical results are demonstrated.

Description

Ozgun, Ozlem/0000-0002-3545-0541

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Turkish CoHE Thesis Center URL

WoS Q

Scopus Q

Q4

Source

IEEE International Symposium on Antennas and Propagation / USNC/URSI National North American Radio Science Meeting -- JUL 19-24, 2015 -- Vancouver, CANADA

Volume

Issue

Start Page

1844

End Page

1845