Testing ourselves

dc.authorscopusid 7004386207
dc.contributor.author Sevgi,L.
dc.date.accessioned 2024-05-25T12:31:36Z
dc.date.available 2024-05-25T12:31:36Z
dc.date.issued 2014
dc.department Okan University en_US
dc.department-temp Sevgi L., Okan University, Faculty of Engineering and Architecture, Electrical and Electronics Eng. Dept., Istanbul, Turkey en_US
dc.description.abstract [No abstract available] en_US
dc.identifier.citationcount 0
dc.identifier.doi 10.1109/MAP.2014.6971969
dc.identifier.issn 1045-9243
dc.identifier.issue 5 en_US
dc.identifier.scopus 2-s2.0-84915770662
dc.identifier.scopusquality Q1
dc.identifier.startpage 288 en_US
dc.identifier.uri https://doi.org/10.1109/MAP.2014.6971969
dc.identifier.uri https://hdl.handle.net/20.500.14517/2303
dc.identifier.volume 56 en_US
dc.identifier.wosquality Q2
dc.language.iso en
dc.publisher IEEE Computer Society en_US
dc.relation.ispartof IEEE Antennas and Propagation Magazine en_US
dc.relation.publicationcategory Diğer en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 0
dc.subject [No Keyword Available] en_US
dc.title Testing ourselves en_US
dc.type Editorial en_US

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