Finite element modeling of double-tip diffraction
| dc.authorscopusid | 14066598600 | |
| dc.authorscopusid | 7004386207 | |
| dc.contributor.author | Ozgun,O. | |
| dc.contributor.author | Sevgi,L. | |
| dc.date.accessioned | 2024-05-25T12:32:02Z | |
| dc.date.available | 2024-05-25T12:32:02Z | |
| dc.date.issued | 2015 | |
| dc.department | Okan University | en_US |
| dc.department-temp | Ozgun O., Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey; Sevgi L., Department of Electrical and Electronics Engineering, Okan University, Istanbul, Turkey | en_US |
| dc.description | IEEE Antennas and Propagation Society; The Institute of Electrical and Electronics Engineers | en_US |
| dc.description.abstract | Finite element (FEM) diffraction modeling of double-tip structure is presented and its accuracy is compared with the uniform theory of diffraction (UTD) and the method of moments (MoM). The locally-conformal perfectly matched layer (PML) approach is utilized to truncate the infinitely-long structure in a finite-sized computational domain. Diffracted field is obtained by using a four-step procedure which extracts the diffracted field from scattered field. Numerical results are demonstrated. © 2015 IEEE. | en_US |
| dc.identifier.citationcount | 0 | |
| dc.identifier.doi | 10.1109/APS.2015.7305311 | |
| dc.identifier.endpage | 1845 | en_US |
| dc.identifier.isbn | 978-147997815-1 | |
| dc.identifier.issn | 1522-3965 | |
| dc.identifier.scopus | 2-s2.0-84953725000 | |
| dc.identifier.scopusquality | Q4 | |
| dc.identifier.startpage | 1844 | en_US |
| dc.identifier.uri | https://doi.org/10.1109/APS.2015.7305311 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14517/2328 | |
| dc.identifier.volume | 2015-October | en_US |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
| dc.relation.ispartof | IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) -- IEEE Antennas and Propagation Society International Symposium, APS 2015 -- 19 July 2015 through 24 July 2015 -- Vancouver -- 117292 | en_US |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.scopus.citedbyCount | 0 | |
| dc.subject | [No Keyword Available] | en_US |
| dc.title | Finite element modeling of double-tip diffraction | en_US |
| dc.type | Conference Object | en_US |